Helm, R.; Egger, W.; Corbel, C.; Sperr, P.; Butterling, M.; Wagner, A.; Liedke, M.O.; Hirschmann, E.; Mitteneder, J.; Mayerhofer, M.;
et al. Defect Characterization of the SiO2/Si Interface Investigated by Drift-Assisted Positron Annihilation Lifetime Spectroscopy. Nanomaterials 2026, 16, 156.
https://doi.org/10.3390/nano16030156
AMA Style
Helm R, Egger W, Corbel C, Sperr P, Butterling M, Wagner A, Liedke MO, Hirschmann E, Mitteneder J, Mayerhofer M,
et al. Defect Characterization of the SiO2/Si Interface Investigated by Drift-Assisted Positron Annihilation Lifetime Spectroscopy. Nanomaterials. 2026; 16(3):156.
https://doi.org/10.3390/nano16030156
Chicago/Turabian Style
Helm, Ricardo, Werner Egger, Catherine Corbel, Peter Sperr, Maik Butterling, Andreas Wagner, Maciej Oskar Liedke, Eric Hirschmann, Johannes Mitteneder, Michael Mayerhofer,
and et al. 2026. "Defect Characterization of the SiO2/Si Interface Investigated by Drift-Assisted Positron Annihilation Lifetime Spectroscopy" Nanomaterials 16, no. 3: 156.
https://doi.org/10.3390/nano16030156
APA Style
Helm, R., Egger, W., Corbel, C., Sperr, P., Butterling, M., Wagner, A., Liedke, M. O., Hirschmann, E., Mitteneder, J., Mayerhofer, M., Lee, K., Duesberg, G. S., Dollinger, G., & Dickmann, M.
(2026). Defect Characterization of the SiO2/Si Interface Investigated by Drift-Assisted Positron Annihilation Lifetime Spectroscopy. Nanomaterials, 16(3), 156.
https://doi.org/10.3390/nano16030156
