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Journal: Nanomaterials, 2023
Volume: 13
Number: 1507

Article: A Coupling Mechanism between Flicker Noise and Hot Carrier Degradations in FinFETs
Authors: by Minghao Liu, Zixuan Sun, Haoran Lu, Cong Shen, Lining Zhang, Runsheng Wang and Ru Huang
Link: https://www.mdpi.com/2079-4991/13/9/1507

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