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Journal: Appl. Sci., 2024
Volume: 14
Number: 6859
Article:
Precision Calibration and Linearity Assessment of Thin Film Force-Sensing Resistors
Authors:
by
Jinwoo Jung, Kihak Lee and Bonghwan Kim
Link:
https://www.mdpi.com/2076-3417/14/16/6859
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