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Journal: Micromachines, 2025
Volume: 16
Number: 1064

Article: Charge Trapping Effects on n−MOSFET Current Mirrors Under TID Radiation
Authors: by Dorsaf Aguir, Sedki Amor, Laurent A. Francis and Mohsen Machhout
Link: https://www.mdpi.com/2072-666X/16/9/1064

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