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Journal: MicromachinesVolume: 15Number: 450
Article: Analyzing Various Structural and Temperature Characteristics of Floating Gate Field Effect Transistors Applicable to Fine-Grain Logic-in-Memory Devices
  • Authors:
  • Sangki Cho1,
  • Sueyeon Kim2 and
  • Myounggon Kang3
  • et al.
Link: https://www.mdpi.com/2072-666X/15/4/450

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