Halbach, C.; Rochus, V.; Genoe, J.; Rottenberg, X.; Cheyns, D.; Heremans, P.
Analysis of Collapse–Snapback Phenomena in Capacitive Micromachined Ultrasound Transducers. Micromachines 2025, 16, 160.
https://doi.org/10.3390/mi16020160
AMA Style
Halbach C, Rochus V, Genoe J, Rottenberg X, Cheyns D, Heremans P.
Analysis of Collapse–Snapback Phenomena in Capacitive Micromachined Ultrasound Transducers. Micromachines. 2025; 16(2):160.
https://doi.org/10.3390/mi16020160
Chicago/Turabian Style
Halbach, Chloé, Veronique Rochus, Jan Genoe, Xavier Rottenberg, David Cheyns, and Paul Heremans.
2025. "Analysis of Collapse–Snapback Phenomena in Capacitive Micromachined Ultrasound Transducers" Micromachines 16, no. 2: 160.
https://doi.org/10.3390/mi16020160
APA Style
Halbach, C., Rochus, V., Genoe, J., Rottenberg, X., Cheyns, D., & Heremans, P.
(2025). Analysis of Collapse–Snapback Phenomena in Capacitive Micromachined Ultrasound Transducers. Micromachines, 16(2), 160.
https://doi.org/10.3390/mi16020160