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Open AccessArticle

In-Line Holography in Transmission Electron Microscopy for the Atomic Resolution Imaging of Single Particle of Radiation-Sensitive Matter

Istituto per la Microelettronica ed i Microsistemi, Consiglio Nazionale delle Ricerche (CNR-IMM), Sezione di Lecce, Campus Universitario, via per Monteroni, 73100 Lecce, Italy
Materials 2020, 13(6), 1413; https://doi.org/10.3390/ma13061413
Received: 27 February 2020 / Revised: 16 March 2020 / Accepted: 18 March 2020 / Published: 20 March 2020
In this paper, for the first time it is shown how in-line holography in Transmission Electron Microscopy (TEM) enables the study of radiation-sensitive nanoparticles of organic and inorganic materials providing high-contrast holograms of single nanoparticles, while illuminating specimens with a density of current as low as 1–2 eÅ−2s−1. This provides a powerful method for true single-particle atomic resolution imaging and opens up new perspectives for the study of soft matter in biology and materials science. The approach is not limited to a particular class of TEM specimens, such as homogenous samples or samples specially designed for a particular TEM experiment, but has better application in the study of those specimens with differences in shape, chemical composition, crystallography, and orientation, which cannot be currently addressed at atomic resolution. View Full-Text
Keywords: TEM; in-line holography; single particle imaging; atomic resolution imaging; radiation damage; soft matter; nanostructured drugs; organic materials TEM; in-line holography; single particle imaging; atomic resolution imaging; radiation damage; soft matter; nanostructured drugs; organic materials
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MDPI and ACS Style

Carlino, E. In-Line Holography in Transmission Electron Microscopy for the Atomic Resolution Imaging of Single Particle of Radiation-Sensitive Matter. Materials 2020, 13, 1413. https://doi.org/10.3390/ma13061413

AMA Style

Carlino E. In-Line Holography in Transmission Electron Microscopy for the Atomic Resolution Imaging of Single Particle of Radiation-Sensitive Matter. Materials. 2020; 13(6):1413. https://doi.org/10.3390/ma13061413

Chicago/Turabian Style

Carlino, Elvio. 2020. "In-Line Holography in Transmission Electron Microscopy for the Atomic Resolution Imaging of Single Particle of Radiation-Sensitive Matter" Materials 13, no. 6: 1413. https://doi.org/10.3390/ma13061413

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