Khouchaf, L.; Boulahya, K.; Das, P.P.; Nicolopoulos, S.; Kis, V.K.; Lábár, J.L.
Study of the Microstructure of Amorphous Silica Nanostructures Using High-Resolution Electron Microscopy, Electron Energy Loss Spectroscopy, X-ray Powder Diffraction, and Electron Pair Distribution Function. Materials 2020, 13, 4393.
https://doi.org/10.3390/ma13194393
AMA Style
Khouchaf L, Boulahya K, Das PP, Nicolopoulos S, Kis VK, Lábár JL.
Study of the Microstructure of Amorphous Silica Nanostructures Using High-Resolution Electron Microscopy, Electron Energy Loss Spectroscopy, X-ray Powder Diffraction, and Electron Pair Distribution Function. Materials. 2020; 13(19):4393.
https://doi.org/10.3390/ma13194393
Chicago/Turabian Style
Khouchaf, Lahcen, Khalid Boulahya, Partha Pratim Das, Stavros Nicolopoulos, Viktória Kovács Kis, and János L. Lábár.
2020. "Study of the Microstructure of Amorphous Silica Nanostructures Using High-Resolution Electron Microscopy, Electron Energy Loss Spectroscopy, X-ray Powder Diffraction, and Electron Pair Distribution Function" Materials 13, no. 19: 4393.
https://doi.org/10.3390/ma13194393
APA Style
Khouchaf, L., Boulahya, K., Das, P. P., Nicolopoulos, S., Kis, V. K., & Lábár, J. L.
(2020). Study of the Microstructure of Amorphous Silica Nanostructures Using High-Resolution Electron Microscopy, Electron Energy Loss Spectroscopy, X-ray Powder Diffraction, and Electron Pair Distribution Function. Materials, 13(19), 4393.
https://doi.org/10.3390/ma13194393