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Article

Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks

Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea
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Author to whom correspondence should be addressed.
Academic Editor: Alessandra Rizzardi
Sensors 2021, 21(18), 6111; https://doi.org/10.3390/s21186111
Received: 2 August 2021 / Revised: 8 September 2021 / Accepted: 10 September 2021 / Published: 12 September 2021
(This article belongs to the Section Internet of Things)
Cryptographic circuits generally are used for applications of wireless sensor networks to ensure security and must be tested in a manufacturing process to guarantee their quality. Therefore, a scan architecture is widely used for testing the circuits in the manufacturing test to improve testability. However, during scan testing, test-power consumption becomes more serious as the number of transistors and the complexity of chips increase. Hence, the scan chain reordering method is widely applied in a low-power architecture because of its ability to achieve high power reduction with a simple architecture. However, achieving a significant power reduction without excessive computational time remains challenging. In this paper, a novel scan correlation-aware scan cluster reordering is proposed to solve this problem. The proposed method uses a new scan correlation-aware clustering in order to place highly correlated scan cells adjacent to each other. The experimental results demonstrate that the proposed method achieves a significant power reduction with a relatively fast computational time compared with previous methods. Therefore, by improving the reliability of cryptography circuits in wireless sensor networks (WSNs) through significant test-power reduction, the proposed method can ensure the security and integrity of information in WSNs. View Full-Text
Keywords: wireless sensor networks; cryptography; design for testability (DFT); low-power testing; scan chain reordering wireless sensor networks; cryptography; design for testability (DFT); low-power testing; scan chain reordering
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MDPI and ACS Style

Lee, S.; Cho, K.; Kim, J.; Park, J.; Lee, I.; Kang, S. Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks. Sensors 2021, 21, 6111. https://doi.org/10.3390/s21186111

AMA Style

Lee S, Cho K, Kim J, Park J, Lee I, Kang S. Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks. Sensors. 2021; 21(18):6111. https://doi.org/10.3390/s21186111

Chicago/Turabian Style

Lee, Sangjun, Kyunghwan Cho, Jihye Kim, Jongho Park, Inhwan Lee, and Sungho Kang. 2021. "Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks" Sensors 21, no. 18: 6111. https://doi.org/10.3390/s21186111

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