Liu, X.; Zhao, K.; Wang, X.; Zhang, C.; Zhang, F.; Yuan, R.; Lamlom, S.F.; Zhang, B.; Ren, H.
Genome-Wide Characterization of a Carbon Ion Beam-Induced Soybean Mutant Population Reveals Extensive Genetic Variation for Trait Improvement. Int. J. Mol. Sci. 2025, 26, 9304.
https://doi.org/10.3390/ijms26199304
AMA Style
Liu X, Zhao K, Wang X, Zhang C, Zhang F, Yuan R, Lamlom SF, Zhang B, Ren H.
Genome-Wide Characterization of a Carbon Ion Beam-Induced Soybean Mutant Population Reveals Extensive Genetic Variation for Trait Improvement. International Journal of Molecular Sciences. 2025; 26(19):9304.
https://doi.org/10.3390/ijms26199304
Chicago/Turabian Style
Liu, Xiulin, Kezhen Zhao, Xueyang Wang, Chunlei Zhang, Fengyi Zhang, Rongqiang Yuan, Sobhi F. Lamlom, Bixian Zhang, and Honglei Ren.
2025. "Genome-Wide Characterization of a Carbon Ion Beam-Induced Soybean Mutant Population Reveals Extensive Genetic Variation for Trait Improvement" International Journal of Molecular Sciences 26, no. 19: 9304.
https://doi.org/10.3390/ijms26199304
APA Style
Liu, X., Zhao, K., Wang, X., Zhang, C., Zhang, F., Yuan, R., Lamlom, S. F., Zhang, B., & Ren, H.
(2025). Genome-Wide Characterization of a Carbon Ion Beam-Induced Soybean Mutant Population Reveals Extensive Genetic Variation for Trait Improvement. International Journal of Molecular Sciences, 26(19), 9304.
https://doi.org/10.3390/ijms26199304