Huynh, K.-H.; Pham, X.-H.; Hahm, E.; An, J.; Kim, H.-M.; Jo, A.; Seong, B.; Kim, Y.-H.; Son, B.S.; Kim, J.;
et al. Facile Histamine Detection by Surface-Enhanced Raman Scattering Using SiO2@Au@Ag Alloy Nanoparticles. Int. J. Mol. Sci. 2020, 21, 4048.
https://doi.org/10.3390/ijms21114048
AMA Style
Huynh K-H, Pham X-H, Hahm E, An J, Kim H-M, Jo A, Seong B, Kim Y-H, Son BS, Kim J,
et al. Facile Histamine Detection by Surface-Enhanced Raman Scattering Using SiO2@Au@Ag Alloy Nanoparticles. International Journal of Molecular Sciences. 2020; 21(11):4048.
https://doi.org/10.3390/ijms21114048
Chicago/Turabian Style
Huynh, Kim-Hung, Xuan-Hung Pham, Eunil Hahm, Jaehyun An, Hyung-Mo Kim, Ahla Jo, Bomi Seong, Yoon-Hee Kim, Byung Sung Son, Jaehi Kim,
and et al. 2020. "Facile Histamine Detection by Surface-Enhanced Raman Scattering Using SiO2@Au@Ag Alloy Nanoparticles" International Journal of Molecular Sciences 21, no. 11: 4048.
https://doi.org/10.3390/ijms21114048
APA Style
Huynh, K.-H., Pham, X.-H., Hahm, E., An, J., Kim, H.-M., Jo, A., Seong, B., Kim, Y.-H., Son, B. S., Kim, J., Rho, W.-Y., & Jun, B.-H.
(2020). Facile Histamine Detection by Surface-Enhanced Raman Scattering Using SiO2@Au@Ag Alloy Nanoparticles. International Journal of Molecular Sciences, 21(11), 4048.
https://doi.org/10.3390/ijms21114048