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Journal: Eng, 2024
Volume: 5
Number: 27
Article:
Smart Electrical Screening Methodology for Channel Hole Defects of 3D Vertical NAND (VNAND) Flash Memory
Authors:
by
Beomjun Kim, Gyeongseob Seo and Myungsuk Kim
Link:
https://www.mdpi.com/2673-4117/5/1/27
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