Special Issue "Precision Measurements and Metrology Using Lasers"


A special issue of Technologies (ISSN 2227-7080).

Deadline for manuscript submissions: closed (30 April 2014)

Special Issue Editor

Guest Editor
Dr. David Kerr
Wolfson School of Mechanical and Manufacturing Engineering, Loughborough University, Ashby Road, Loughborough Leicestershire, UK
Website: http://www.lboro.ac.uk/departments/mechman/staff/david-kerr.html
E-Mail: D.Kerr@lboro.ac.uk
Phone: +44-1509-227559
Fax: +44-1509-227648
Interests: optical metrology; fringe analysis; digital image processing; industrial machine vision

Special Issue Information

Dear Colleagues,

Since its inception around 1960, the laser has found myriad applications in science, engineering, and medicine. The use of lasers in metrology includes the precise measurement of distance, velocity, acceleration, torque, strain, surface finish, and shape. For more than 50 years, the unique properties of laser radiation (i.e., coherence, narrow wavelength, low beam divergence and high intensity) have made lasers ideal for accurate and repeatable non-contact measurement. This special issue aims to publish new research and novel applications in all types of laser metrology and precision measurement. It is my pleasure to encourage both theoretical and empirical papers in this ever-expanding and exciting discipline.

Dr. David Kerr
Guest Editor


Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. Papers will be published continuously (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are refereed through a peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Technologies is an international peer-reviewed Open Access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. For the first couple of issues the Article Processing Charge (APC) will be waived for well-prepared manuscripts. English correction and/or formatting fees of 250 CHF (Swiss Francs) will be charged in certain cases for those articles accepted for publication that require extensive additional formatting and/or English corrections.


  • laser
  • metrology
  • speckle
  • interferometry
  • coherent
  • measurement
  • quality
  • precision

Published Papers (3 papers)

by , , , ,  and
Technologies 2014, 2(3), 129-142; doi:10.3390/technologies2030129
Received: 29 April 2014; in revised form: 27 June 2014 / Accepted: 15 July 2014 / Published: 6 August 2014
Show/Hide Abstract | PDF Full-text (1087 KB) | HTML Full-text | XML Full-text

by ,  and
Technologies 2014, 2(3), 115-128; doi:10.3390/technologies2030115
Received: 30 April 2014; in revised form: 23 June 2014 / Accepted: 24 June 2014 / Published: 4 July 2014
Show/Hide Abstract | PDF Full-text (610 KB) | HTML Full-text | XML Full-text

Technologies 2014, 2(2), 54-75; doi:10.3390/technologies2020054
Received: 13 December 2013; in revised form: 16 March 2014 / Accepted: 27 March 2014 / Published: 5 May 2014
Show/Hide Abstract | PDF Full-text (991 KB) | HTML Full-text | XML Full-text

Last update: 2 September 2013

Technologies EISSN 2227-7080 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert