Special Issue "X-ray Imaging in Materials Science"

Guest Editor
Prof. Dr. Jung Ho Je
Department of Materials Science and Engineering, Pohang University of Science and Technology, San 31 Hyojadong, Pohang, 790-784, Korea
Website: http://xic.postech.ac.kr/
E-Mail:
Phone: +82 54 279 2143
Fax: +82 54 279 2992
Interests: hydrogels; polymeric microstructures; silicon wafer; silicon carbide; surface treatment of water; microradiology; microtomography

Dear Colleagues,

The theme of this special issue is X-ray Imaging that focuses on instrumentation and application of X-ray microscopy in materials science. X-ray imaging with recent improvements in sources and optics is rapidly expanding in research and science of various materials including soft materials, condensed-matter materials, biomaterials, nanomaterials, etc.

This issue of Materials covers current advances in X-ray imaging techniques such as phase-contrast imaging, coherent diffraction imaging, tomography, topography, and their applications to materials science. Perspectives are welcome on upcoming new techniques or facilities, especially X-ray free-electron laser (XFEL), which will greatly extend X-ray imaging to femtosecond time domain and to interatomic length scales. Finally, we encourage considering a variety of X-ray-induced interactions, which become important for the synthesis of new materials, for the discovery of new phenomenon, or for the prevention of radiation damages, since material properties could be significantly changed with X-ray irradiation.

Prof. Dr. Jung Ho Je
Guest Editor

Submission

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. Papers will be published continuously (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are refereed through a peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed Open Access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 800 CHF (Swiss Francs).

• X-ray imaging
• X-ray microscopy
• Coherent diffraction imaging
• Phase contrast imaging
• X-ray optics
• XFEL
• Tomography
• Topography
• X-ray-induced phenomena