Special Issue "Techniques and Methods for Advanced Characterization of Luminescent Materials"
A special issue of Materials (ISSN 1996-1944).
Deadline for manuscript submissions: closed (30 September 2017)
Dr. Benjamin Dierre
For a long time, luminescent materials (such as organic or rare-earth/transition metal-doped inorganic phosphors, semiconductors, nanoclusters or quantum dots), have been important in our daily life because of their use in traditional applications in consumer products (lighting, displays) and professional equipment (medical imaging, X-ray computed tomography). Nevertheless, novel luminescent materials with improved or unprecedented properties are still being discovered, and new applications are continuously being developed in the field of energy (solar cells, photo-catalysis), health (biomarkers, disinfection), mobility (smart highway) or security (emergency lighting, currency protection). A continued progress in the performance of luminescent materials and their applications is dependent on a deep understanding of the relationships between their luminescence properties on the one hand and their chemical composition and structure on the other. For such purposes, a detailed characterization of luminescent materials is required, not only with standard approaches but also more and more with sophisticated techniques and methods. Therefore this Special Issue aims at reviewing the latest developments in advanced characterization of luminescent materials, with sophisticated experimental techniques (such as neutron diffraction, combination of electron-beam based techniques, single-particle approaches, EXAFS, XANES, Solid State NMR, Mössbauer spectroscopy, positron annihilation) as well as sophisticated theoretical methods (such as first principles crystal and electronic structure calculations). Papers reviewing state-of-the-art as well as original papers on promising new developments are welcome contributions for this Special Issue of Materials, in order to show that the future of luminescent materials may be even brighter than their rich past.
Prof. Dr. Hubertus T. Hintzen
Dr. Benjamin Dierre
Manuscript Submission Information
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- luminescent material
- advanced techniques
The below list represents only planned manuscripts. Some of these manuscripts have not been received by the Editorial Office yet. Papers submitted to MDPI journals are subject to peer-review.
Title: New developments in cathodoluminescence spectroscopy for the study of luminescent materials
Authors: Daniel den Engelsen, George R. Fern, Paul G. Harris, Terry G. Ireland, Jack Silver
Affiliation: Centre for Phosphor and Display Materials, Wolfson Centre for Materials Processing, Brunel University London, Uxbridge, Middlesex, UB8 3PH, UK
Abstract: Cathodoluminescence (CL) spectroscopy has long been a widely used tool for the study of luminescent electronic materials: phosphors, semiconductors and nano-structured devices [1–5]. Apart from recording spectra it can also be used to probe electronic properties on a nanometre scale with an electron beam in a scanning electron microscope (SEM). In this article three innovations, of which two refer to the combination of CL spectroscopy and microscopy in a SEM, for studying phosphors that have been recently developed in our laboratory will be reviewed [6–9].
The first is a new method to determine the CL-efficiency of thin layers of phosphor powders. When the inorganic phosphor to be investigated is a wide band phosphor with a band gap (Eg) > 5 eV, charging of the phosphor particles will occur upon bombardment with electrons. To overcome this problem of charging a comparison method has been developed [6,7].
The study of CL of luminescent material with a SEM is the second subject to be treated . In ordinary SEMs that are equipped with a photon detector, e.g. a photo multiplier tube (PMT), the panchromatic image of the (luminescent) specimen can reveal features that cannot be observed with the secondary electron detectors of the SEM. A detailed description to determine the decay time of phosphor materials in a SEM without a beam blanking device is presented.
Finally is the combination of microscopy and spectrometry in a transmission electron microscope (TEM) will be presented [9,10]. The JEOL TEM of Brunel University was, when it was delivered, a unique instrument being equipped with a VulcanTM CL detector of Gatan (USA) for imaging (panchromatic) and spectroscopic purposes. This combination of microscopic and spectroscopic techniques enabled the recording of CL-spectra of nanometre-sized specimens and determining spatial differences in one crystal by superimposing the STEM and light images.
In the paper the principles of the three measuring methods and some examples of use will be presented and discussed.