Special Issue "SPM in Materials Science"

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A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Structure Analysis and Characterization".

Deadline for manuscript submissions: closed (30 April 2010)

Special Issue Editor

Guest Editor
Dr. Christine Ortiz
Massachusetts Institute of Technology, Department of Materials Science and Engineering RM 13-4022 77 Massachusetts Avenue, Cambridge, MA 02139, USA
Website: http://web.mit.edu/cortiz/www/
E-Mail: cortiz@mit.edu

Special Issue Information

Dear Colleagues,

This special issue will focus on recent advances in the field of materials science and engineering facilitated by the use of scanning probe microscopy (SPM) instrumentation and methodologies. Example of topics within the scope of this issue include; studies of the nanoelectronic and magnetic properties of materials, nanoscale dynamic mechanical properties of materials, single cell mechanics and mechanotransduction, integration of SPM with chemical characterization techniques, atomic manipulation, high resolution imaging of biological materials and engineered tissues, nanoscale tribology, friction, lubrication, wear, nanoscale adhesion, atomic force microscope-based nanoindentation, single molecule force spectroscopy, and spatially specific nanomechanics.

Dr. Christine Ortiz
Guest Editor

Keywords

  • atomic force microscopy
  • scanning tunneling microscopy
  • nanomechanics
  • nanoindentation
  • single molecule force spectroscopy
  • single cell mechanics

Published Papers (7 papers)

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Displaying article 1-7
p. 4668-4680
by , ,  and
Materials 2010, 3(9), 4668-4680; doi:10.3390/ma3094668
Received: 26 July 2010; Accepted: 8 September 2010 / Published: 14 September 2010
Show/Hide Abstract | Cited by 2 | PDF Full-text (481 KB)
(This article belongs to the Special Issue SPM in Materials Science)
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p. 4518-4549
by
Materials 2010, 3(9), 4518-4549; doi:10.3390/ma3094518
Received: 12 July 2010; in revised form: 6 August 2010 / Accepted: 12 August 2010 / Published: 27 August 2010
Show/Hide Abstract | Cited by 2 | PDF Full-text (3725 KB)
(This article belongs to the Special Issue SPM in Materials Science)
p. 4252-4276
by , , ,  and
Materials 2010, 3(8), 4252-4276; doi:10.3390/ma3084252
Received: 5 July 2010; in revised form: 26 July 2010 / Accepted: 3 August 2010 / Published: 6 August 2010
Show/Hide Abstract | Cited by 9 | PDF Full-text (1755 KB)
(This article belongs to the Special Issue SPM in Materials Science)
p. 4277-4290
by
Materials 2010, 3(8), 4277-4290; doi:10.3390/ma3084277
Received: 3 July 2010; Accepted: 3 August 2010 / Published: 6 August 2010
Show/Hide Abstract | Cited by 3 | PDF Full-text (2737 KB)
(This article belongs to the Special Issue SPM in Materials Science)
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p. 4196-4213
by , , , ,  and
Materials 2010, 3(8), 4196-4213; doi:10.3390/ma3084196
Received: 3 July 2010; in revised form: 20 July 2010 / Accepted: 3 August 2010 / Published: 5 August 2010
Show/Hide Abstract | Cited by 4 | PDF Full-text (1336 KB)
(This article belongs to the Special Issue SPM in Materials Science)
p. 3965-3993
by , , , ,  and
Materials 2010, 3(7), 3965-3993; doi:10.3390/ma3073965
Received: 1 June 2010; in revised form: 22 June 2010 / Accepted: 6 July 2010 / Published: 9 July 2010
Show/Hide Abstract | Cited by 5 | PDF Full-text (1409 KB)
(This article belongs to the Special Issue SPM in Materials Science)
p. 3675-3693
by
Materials 2010, 3(6), 3675-3693; doi:10.3390/ma3063675
Received: 29 April 2010; in revised form: 21 May 2010 / Accepted: 8 June 2010 / Published: 14 June 2010
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Last update: 27 February 2014

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