Deep Learning for X-ray and X-ray Scattering Images

Dear Colleagues,

Visual inspection of x-ray and x-ray scattering images is a popular technique for probing the physical structures of objects. It can be used to reveal broken bones, diagnose diseases, and study the phase transitions of materials. Manual visual inspection, however, is a laborious, expensive, and error-prone process, which usually requires well-trained experts. To this end, there are many benefits of using computer algorithms for automatic visual inspection. One promising approach is to develop these algorithms using deep learning, given the recent advances and successes of deep learning in many other application domains. This Special Issue aims to provide a platform for researchers to present their methods and discuss the benefits and limitations of deep learning for analyzing x-ray and x-ray scattering images. We encourage submissions that describe deep learning techniques for enhancing and analyzing x-ray and x-ray scattering images. Topics of interest include: Image enhancement, noise reduction, image segmentation, 3D reconstruction, image classification, disease diagnostics, and prediction. 

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Journal of Imaging is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1800 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

• Image enhancement
• Noise reduction
• Image segmentation
• 3D reconstruction
• Image classification
• Disease diagnostic and prediction