Next Article in Journal
A Portable Fluorescence Lifetime Spectroscopy Detector for Molecular Diagnosis
Previous Article in Journal
Analysis of SPR Sensors in d-Shaped POF Realized by Hand and Mechanical Polishing
Article Menu

Article Versions

Export Article

Open AccessAbstract
Proceedings 2017, 1(8), 809; doi:10.3390/proceedings1080809

Time-To-Failure Modelling in On-Chip LiDAR Sensors for Automotive Applications

1
Centre for Automation and Robotics, Technical University of Madrid-Spanish National Research Council (UPM-CSIC), Arganda del Rey 28500, Spain
2
Research Center of Advanced and Sustainable Manufacturing, University of Matanzas (UM), Matanzas 44100, Cuba
Presented at the 5th International Symposium on Sensor Science (I3S 2017), Barcelona, Spain, 27–29 September 2017.
*
Author to whom correspondence should be addressed.
Published: 29 November 2017
(This article belongs to the Proceedings of the 5th International Symposium on Sensor Science (I3S 2017))
Download PDF [119 KB, uploaded 29 November 2017]
No abstract available
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

Scifeed alert for new publications

Never miss any articles matching your research from any publisher
  • Get alerts for new papers matching your research
  • Find out the new papers from selected authors
  • Updated daily for 49'000+ journals and 6000+ publishers
  • Define your Scifeed now

SciFeed Share & Cite This Article

MDPI and ACS Style

Castaño, F.; Beruvides, G.; Haber, R.E.; Villalonga, A. Time-To-Failure Modelling in On-Chip LiDAR Sensors for Automotive Applications. Proceedings 2017, 1, 809.

Show more citation formats Show less citations formats

Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Metrics

Article Access Statistics

1

Comments

[Return to top]
Proceedings EISSN 2504-3900 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top