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Condens. Matter 2017, 2(3), 27; doi:10.3390/condmat2030027

Edge Contamination, Bulk Disorder, Flux Front Roughening, and Multiscaling in Type II Superconducting Thin Films

1
Laboratoire Imagerie à Résonance Magnétique Médicale Multi-Modalités, Université Paris Sud, Université Paris Saclay, 91405 Orsay, France
2
Unité Mixte de Physique CNRS/Thales, Université Paris-Sud, Université Paris-Saclay, 91767 Palaiseau, France
3
Laboratoire des Solides Irradiés, Ecole Polytechnique, CNRS, CEA, Université Paris-Saclay, 91128 Palaiseau, France
*
Author to whom correspondence should be addressed.
Academic Editor: Yoshikazu Mizuguchi
Received: 1 July 2017 / Revised: 9 August 2017 / Accepted: 11 August 2017 / Published: 21 August 2017
(This article belongs to the Special Issue Layered Superconductors)
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Abstract

We have investigated the effect of different types of disorder on the propagation, roughness, and scaling properties of magnetic flux fronts in a type II superconductor. A progression from the usual (Kardar–Parisi–Zhang-type) scaling to multiscaling is observed as the disorder strength is increased. A hierarchy of disorder strengths is established for YBa 2 Cu 3 O 7 δ thin films. The results cast light on the physical origin of the roughening of flux fronts, and they are of interest for the design and elimination of flux noise in microscopic superconducting thin-film devices. View Full-Text
Keywords: type II superconductivity; vortex matter; flux pinning; critical current density; flux penetration; critical state; disorder; irradiation; roughening of elastic manifolds; nonlinear diffusion type II superconductivity; vortex matter; flux pinning; critical current density; flux penetration; critical state; disorder; irradiation; roughening of elastic manifolds; nonlinear diffusion
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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MDPI and ACS Style

Geahel, M.; Jouanny, I.; Gorse-Pomonti, D.; Poirier-Quinot, M.; Briatico, J.; van der Beek, C.J. Edge Contamination, Bulk Disorder, Flux Front Roughening, and Multiscaling in Type II Superconducting Thin Films. Condens. Matter 2017, 2, 27.

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