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J. Imaging 2018, 4(5), 69; https://doi.org/10.3390/jimaging4050069

Applications of Laboratory-Based Phase-Contrast Imaging Using Speckle Tracking Technique towards High Energy X-Rays

1
Diamond Light Source, Harwell Science and Innovation Campus, Didcot OX11 0DE, Oxfordshire, UK
2
Empa, Swiss Federal Laboratories for Materials Science and Technology, 8600 Dübendorf, Switzerland
Now at Excillum AB, Torshamnsgatan 35, 164 40 Kista, Sweden.
*
Author to whom correspondence should be addressed.
Received: 15 March 2018 / Revised: 27 April 2018 / Accepted: 8 May 2018 / Published: 11 May 2018
(This article belongs to the Special Issue Phase-Contrast and Dark-Field Imaging)
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Abstract

The recently developed speckle-based technique is a promising candidate for laboratory-based X-ray phase-contrast imaging due to its compatibility with polychromatic X-rays, multi-modality and flexibility. Previously, successful implementations of the method on laboratory systems have been shown mostly with energies less than 20 keV on samples with materials like soft tissues or polymer. Higher energy X-rays are needed for penetrating materials with a higher atomic number or that are thicker in size. A first demonstration using high energy X-rays was recently given. Here, we present more potential application examples, i.e., a multi-contrast imaging of an IC chip and a phase tomography of a mortar sample, at an average photon energy of 40 keV using a laboratory X-ray tube. We believe the results demonstrate the applicability of this technique in a wide range of fields for non-destructive examination in industry and material science. View Full-Text
Keywords: X-ray imaging; phase contrast; speckle; multi-contrast; tomography; chip; cement X-ray imaging; phase contrast; speckle; multi-contrast; tomography; chip; cement
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Zhou, T.; Yang, F.; Kaufmann, R.; Wang, H. Applications of Laboratory-Based Phase-Contrast Imaging Using Speckle Tracking Technique towards High Energy X-Rays. J. Imaging 2018, 4, 69.

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