Mixed-Signal Hardware Security: Attacks and Countermeasures for ΔΣ ADC
Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL 32816, USA
Author to whom correspondence should be addressed.
Received: 10 July 2017 / Revised: 10 August 2017 / Accepted: 21 August 2017 / Published: 23 August 2017
Mixed-signal integrated circuits (ICs) play an eminent and critical role in design and development of the embedded systems leveraged within smart weapons and military systems. These ICs can be a golden target for adversaries to compromise in order to function maliciously. In this work, we study the security aspects of a tunnel field effect transistor (TFET)-based first-order one-bit delta-sigma (
) analog to digital converter (ADC) through proposing four attack and one defense models. The first attack manipulates the input signal to the
modulator. The second attack manipulates the analog version of the modulator output bit and is triggered by the noise signal. The third attack manipulates the modulator output bit and has a controllable trigger mechanism. The fourth attack manipulates the analog version of the modulator output bit and is triggered by a victim capacitance within the chip. For the defense, a number of signal processing filters are used in order to purge the analog version of the modulator output bit for elimination of the malicious unwanted features, introduced by the attacks. According to the simulation results, the second threat model displays the strongest attack. Derived from the countermeasure evaluation, the best filter to confront the threat models is the robust regression using the least absolute residual computing method.
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MDPI and ACS Style
Taheri, S.; Yuan, J.-S. Mixed-Signal Hardware Security: Attacks and Countermeasures for ΔΣ ADC. Electronics 2017, 6, 60.
Taheri S, Yuan J-S. Mixed-Signal Hardware Security: Attacks and Countermeasures for ΔΣ ADC. Electronics. 2017; 6(3):60.
Taheri, Shayan; Yuan, Jiann-Shiun. 2017. "Mixed-Signal Hardware Security: Attacks and Countermeasures for ΔΣ ADC." Electronics 6, no. 3: 60.
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