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Open AccessConcept Paper
Electronics 2015, 4(3), 526-537; doi:10.3390/electronics4030526

Redundancy Determination of HVDC MMC Modules

KEPCO Research Institute, 105 Munjiro Yuseong, Daejeon 305-760, Korea
Author to whom correspondence should be addressed.
Received: 30 April 2015 / Revised: 16 July 2015 / Accepted: 29 July 2015 / Published: 4 August 2015
(This article belongs to the Special Issue Multi-Level Converters)
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An availability and a reliability prediction has been made for a high-voltage direct-current (HVDC) module of VSC (Voltage Source Converter) containing DC/DC converter, gate driver, capacitor and insulated gate bipolar transistors (IGBT). This prediction was made using published failure rates for the electronic equipment. The purpose of this prediction is to determinate the additional module redundancy of VSC and the used method is “binomial failure method”. View Full-Text
Keywords: reliability; HVDC valve module redundancy reliability; HVDC valve module redundancy

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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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Kim, C.; Lee, S. Redundancy Determination of HVDC MMC Modules. Electronics 2015, 4, 526-537.

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