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Morphology, Electrical Performance and Potentiometry of PDIF-CN2 Thin-Film Transistors on HMDS-Treated and Bare Silicon Dioxide
Electronics 2014, 3(1), 112-121; doi:10.3390/electronics3010112

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article pdf uploaded. 4 March 2014 09:11 CET Version of Record http://www.mdpi.com/2079-9292/3/1/112/pdf
article html file updated 19 August 2015 22:19 CEST Original file http://www.mdpi.com/2079-9292/3/1/112/html
Electronics EISSN 2079-9292 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert