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Morphology, Electrical Performance and Potentiometry of PDIF-CN2 Thin-Film Transistors on HMDS-Treated and Bare Silicon Dioxide
Electronics 2014, 3(1), 112-121; doi:10.3390/electronics3010112

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Article Published4 March 2014 09:11 CET
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Electronics EISSN 2079-9292 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert