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Journal: J. Low Power Electron. Appl., 2014
Volume: 4
Number: 110

Article: Analysis of Threshold Voltage Flexibility in Ultrathin-BOX SOI FinFETs
Authors: by Kazuhiko Endo, Shinji Migita, Yuki Ishikawa, Takashi Matsukawa, Shin-ichi O'uchi, Junji Tsukada, Wataru Mizubayashi, Yukinori Morita, Hiroyuki Ota, Hitomi Yamauchi and Meishoku Masahara
Link: https://www.mdpi.com/2079-9268/4/2/110

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