Nanomaterials 2012, 2(3), 251-267; doi:10.3390/nano2030251
Article

Effects of Varied Cleaning Methods on Ni-5% W Substrate for Dip-Coating of Water-based Buffer Layers: An X-ray Photoelectron Spectroscopy Study

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Received: 31 May 2012; in revised form: 17 July 2012 / Accepted: 25 July 2012 / Published: 9 August 2012
(This article belongs to the Special Issue New Developments in Nanomaterial Analysis)
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Abstract: This work describes various combinations of cleaning methods involved in the preparation of Ni-5% W substrates for the deposition of buffer layers using water-based solvents. The substrate has been studied for its surface properties using X-ray photoelectron spectroscopy (XPS). The contaminants in the substrates have been quantified and the appropriate cleaning method was chosen in terms of contaminants level and showing good surface crystallinity to further consider them for depositing chemical solution-based buffer layers for Y1Ba2Cu3Oy (YBCO) coated conductors.
Keywords: X-ray photoelectron spectroscopy; cleaning of Ni-5% W substrate; depth profile studies; thin films and coatings
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MDPI and ACS Style

Narayanan, V.; Bruneel, E.; Hühne, R.; Van Driessche, I. Effects of Varied Cleaning Methods on Ni-5% W Substrate for Dip-Coating of Water-based Buffer Layers: An X-ray Photoelectron Spectroscopy Study. Nanomaterials 2012, 2, 251-267.

AMA Style

Narayanan V, Bruneel E, Hühne R, Van Driessche I. Effects of Varied Cleaning Methods on Ni-5% W Substrate for Dip-Coating of Water-based Buffer Layers: An X-ray Photoelectron Spectroscopy Study. Nanomaterials. 2012; 2(3):251-267.

Chicago/Turabian Style

Narayanan, Vyshnavi; Bruneel, Els; Hühne, Ruben; Van Driessche, Isabel. 2012. "Effects of Varied Cleaning Methods on Ni-5% W Substrate for Dip-Coating of Water-based Buffer Layers: An X-ray Photoelectron Spectroscopy Study." Nanomaterials 2, no. 3: 251-267.

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