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Appl. Sci. 2018, 8(3), 321; https://doi.org/10.3390/app8030321

Characteristic Analysis of Compact Spectrometer Based on Off-Axis Meta-Lens

Centre for Optical and Electromagnetic Research, State Key Lab of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310058, China
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Received: 18 January 2018 / Revised: 14 February 2018 / Accepted: 23 February 2018 / Published: 26 February 2018
(This article belongs to the Special Issue Metasurfaces: Physics and Applications)
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Abstract

Ultra-compact spectrometers with high-resolution and/or broadband features have long been pursued for their wide application prospects. The off-axis meta-lens, a new species of planar optical instruments, provides a unique and feasible way to realize these goals. Here we give a detailed investigation of the influences of structural parameters of meta-lens-based spectrometers on the effective spectral range and the spectral resolution using both wave optics and geometrical optics methods. Aimed for different usages, two types of meta-lens based spectrometers are numerically proposed: one is a wideband spectrometer working at 800–1800 nm wavelengths with the spectral resolution of 2–5 nm and the other is a narrowband one working at the 780–920 nm band but with a much higher spectral resolution of 0.15–0.6 nm. The tolerance for fabrication errors is also discussed in the end. These provides a prominent way to design and integrate planar film-based spectrometers for various instrumental applications. View Full-Text
Keywords: meta-lens; metasurface; spectrometer; dispersion; off-axis optical system meta-lens; metasurface; spectrometer; dispersion; off-axis optical system
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).
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Zhou, Y.; Chen, R.; Ma, Y. Characteristic Analysis of Compact Spectrometer Based on Off-Axis Meta-Lens. Appl. Sci. 2018, 8, 321.

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