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Appl. Sci. 2017, 7(9), 899; doi:10.3390/app7090899

A Dispersive Inelastic X-ray Scattering Spectrometer for Use at X-ray Free Electron Lasers

1
Paul Scherrer Institut, 5232 Villigen, Switzerland
2
Institute of Physics, Jan Kochanowski University, 25-001 Kielce, Poland
3
Max-Planck-Institute for Chemical Energy Conversion, 45470 Mülheim an der Ruhr, Germany
4
The Henryk Niewodniczanski Institute of Nuclear Physics, Polish Academy of Sciences, 31342 Kraków, Poland
*
Authors to whom correspondence should be addressed.
Academic Editor: Kiyoshi Ueda
Received: 14 July 2017 / Revised: 25 August 2017 / Accepted: 26 August 2017 / Published: 1 September 2017
(This article belongs to the Special Issue X-Ray Free-Electron Laser)
View Full-Text   |   Download PDF [2073 KB, uploaded 1 September 2017]   |  

Abstract

We report on the application of a short working distance von Hamos geometry spectrometer to measure the inelastic X-ray scattering (IXS) signals from solids and liquids. In contrast to typical IXS instruments where the spectrometer geometry is fixed and the incoming beam energy is scanned, the von Hamos geometry allows measurements to be made using a fixed optical arrangement with no moving parts. Thanks to the shot-to-shot capability of the spectrometer setup, we anticipate its application for the IXS technique at X-ray free electron lasers (XFELs). We discuss the capability of the spectrometer setup for IXS studies in terms of efficiency and required total incident photon flux for a given signal-to-noise ratio. The ultimate energy resolution of the spectrometer, which is a key parameter for IXS studies, was measured to the level of 150 meV at short crystal radius thanks to the application of segmented crystals for X-ray diffraction. The short working distance is a key parameter for spectrometer efficiency that is necessary to measure weak IXS signals. View Full-Text
Keywords: dispersive X-ray spectrometer; von Hamos geometry; inelastic X-ray scattering; X-ray free electron laser; SwissFEL; segmented crystal dispersive X-ray spectrometer; von Hamos geometry; inelastic X-ray scattering; X-ray free electron laser; SwissFEL; segmented crystal
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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MDPI and ACS Style

Szlachetko, J.; Nachtegaal, M.; Grolimund, D.; Knopp, G.; Peredkov, S.; Czapla–Masztafiak, J.; Milne, C.J. A Dispersive Inelastic X-ray Scattering Spectrometer for Use at X-ray Free Electron Lasers. Appl. Sci. 2017, 7, 899.

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