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Appl. Sci. 2017, 7(6), 568; doi:10.3390/app7060568

Measuring the Reflection Matrix of a Rough Surface

1
Department of Engineering Physics, Air Force Institute of Technology, Wright-Patterson AFB, OH 45433, USA
2
Department of Mathematics & Statistics, Air Force Institute of Technology, Wright-Patterson AFB, OH 45433, USA
*
Author to whom correspondence should be addressed.
Academic Editor: Totaro Imasaka
Received: 17 March 2017 / Revised: 1 May 2017 / Accepted: 22 May 2017 / Published: 31 May 2017
(This article belongs to the Section Optics and Lasers)
View Full-Text   |   Download PDF [855 KB, uploaded 8 June 2017]   |  

Abstract

Phase modulation methods for imaging around corners with reflectively scattered light required illumination of the occluded scene with a light source either in the scene or with direct line of sight to the scene. The RM (reflection matrix) allows control and refocusing of light after reflection, which could provide a means of illuminating an occluded scene without access or line of sight. Two optical arrangements, one focal-plane, the other an imaging system, were used to measure the RM of five different rough-surface reflectors. Intensity enhancement values of up to 24 were achieved. Surface roughness, correlation length, and slope were examined for their effect on enhancement. Diffraction-based simulations were used to corroborate experimental results. View Full-Text
Keywords: scattering; reflection matrix; transmission matrix; enhancement; phase modulation; spatial light modulator scattering; reflection matrix; transmission matrix; enhancement; phase modulation; spatial light modulator
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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Burgi, K.; Marciniak, M.; Oxley, M.; Nauyoks, S. Measuring the Reflection Matrix of a Rough Surface. Appl. Sci. 2017, 7, 568.

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