Measuring the Reflection Matrix of a Rough Surface
AbstractPhase modulation methods for imaging around corners with reflectively scattered light required illumination of the occluded scene with a light source either in the scene or with direct line of sight to the scene. The RM (reflection matrix) allows control and refocusing of light after reflection, which could provide a means of illuminating an occluded scene without access or line of sight. Two optical arrangements, one focal-plane, the other an imaging system, were used to measure the RM of five different rough-surface reflectors. Intensity enhancement values of up to 24 were achieved. Surface roughness, correlation length, and slope were examined for their effect on enhancement. Diffraction-based simulations were used to corroborate experimental results. View Full-Text
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Burgi, K.; Marciniak, M.; Oxley, M.; Nauyoks, S. Measuring the Reflection Matrix of a Rough Surface. Appl. Sci. 2017, 7, 568.
Burgi K, Marciniak M, Oxley M, Nauyoks S. Measuring the Reflection Matrix of a Rough Surface. Applied Sciences. 2017; 7(6):568.Chicago/Turabian Style
Burgi, Kenneth; Marciniak, Michael; Oxley, Mark; Nauyoks, Stephen. 2017. "Measuring the Reflection Matrix of a Rough Surface." Appl. Sci. 7, no. 6: 568.
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