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Polymers 2018, 10(1), 49; https://doi.org/10.3390/polym10010049

Theoretical Study on Synchronous Characterization of Surface and Interfacial Mechanical Properties of Thin-Film/Substrate Systems with Residual Stress Based on Pressure Blister Test Technique

1
School of Civil Engineering, Chongqing University, Chongqing 400045, China
2
Key Laboratory of New Technology for Construction of Cities in Mountain Area (Chongqing University), Ministry of Education, Chongqing 400045, China
*
Author to whom correspondence should be addressed.
Received: 29 October 2017 / Revised: 10 December 2017 / Accepted: 4 January 2018 / Published: 7 January 2018
(This article belongs to the Collection Polymeric Adhesives)
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Abstract

In this study, based on the pressure blister test technique, a theoretical study on the synchronous characterization of surface and interfacial mechanical properties of thin-film/substrate systems with residual stress was presented, where the problem of axisymmetric deformation of a blistering film with initial stress was analytically solved and its closed-form solution was presented. The expressions to determine Poisson’s ratios, Young’s modulus, and residual stress of surface thin films were derived; the work done by the applied external load and the elastic energy stored in the blistering thin film were analyzed in detail and their expressions were derived; and the interfacial adhesion energy released per unit delamination area of thin-film/substrate (i.e., energy release rate) was finally presented. The synchronous characterization technique presented here has theoretically made a big step forward, due to the consideration for the residual stress in surface thin films. View Full-Text
Keywords: thin-film/substrate system; residual stress; pressure blister test; interfacial adhesion energy; synchronous characterization thin-film/substrate system; residual stress; pressure blister test; interfacial adhesion energy; synchronous characterization
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).
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Yang, Z.-X.; Sun, J.-Y.; Li, K.; Lian, Y.-S.; He, X.-T.; Zheng, Z.-L. Theoretical Study on Synchronous Characterization of Surface and Interfacial Mechanical Properties of Thin-Film/Substrate Systems with Residual Stress Based on Pressure Blister Test Technique. Polymers 2018, 10, 49.

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