A Study of Extended Defects in Surface Damaged Crystals
AbstractWe have analyzed by transmission electron microscopy silicon and GaAs crystals polished with sandpapers of different grain size. The surface damage induced a crystal permanent convex curvature with a radius of the order of a few meters. The curvature is due to a compressive strain generated in the damaged zone of the sample. Contrary to what was reported in the literature, the only defects detected by transmission electron microscopy were dislocations penetrating a few microns from the surface. Assuming the surface damage as a kind of continuous indentation, a simple model able to explain the observed compressive strain is given. View Full-Text
Share & Cite This Article
Ferrari, C.; Ghica, C.; Rotunno, E. A Study of Extended Defects in Surface Damaged Crystals. Crystals 2018, 8, 67.
Ferrari C, Ghica C, Rotunno E. A Study of Extended Defects in Surface Damaged Crystals. Crystals. 2018; 8(2):67.Chicago/Turabian Style
Ferrari, Claudio; Ghica, Corneliu; Rotunno, Enzo. 2018. "A Study of Extended Defects in Surface Damaged Crystals." Crystals 8, no. 2: 67.
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.