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Crystals 2017, 7(12), 356; doi:10.3390/cryst7120356

Structural Characterization of Perpendicularly Aligned Submicrometer-Thick Synthetic Glycolipid Polycrystalline Films Using Conventional X-ray Diffraction

1
Department of Materials and Life Science, Faculty of Science and Technology, Seikei University, Musashino-Shi 180-8633, Japan
2
Department of Physics, School of Science and Technology, Kwansei Gakuin University, Sanda 669-1337, Japan
*
Author to whom correspondence should be addressed.
Academic Editor: Shujun Zhang
Received: 30 October 2017 / Revised: 17 November 2017 / Accepted: 29 November 2017 / Published: 1 December 2017
(This article belongs to the Section Crystal Engineering)
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Abstract

The structural analysis of the synthetic glycolipid crystalline phase has been performed during the past few decades; however, it has not been sufficiently understood in terms of both static and dynamic aspects. We have recently shown that grazing incidence X-ray diffraction (GIXD) affords better information than conventional powder X-ray diffraction (PXRD) for the crystal structure analysis of octyl β-d-galactoside (MOβGal) using sub-micrometer-thick crystalline films and a two-dimensional detector, together with a synchrotron radiation source. However, access to this technique is not universal because of the limited machine time at the required synchrotron radiation sources. Herein, we employed XRD analysis on MOβGal hemihydrate crystalline films using commercial X-ray sources instead of synchrotron radiation sources to extend the availability of the methodology. We investigated some technical aspects of the methodology, such as incident angle and radiation time, using MOβGal polycrystalline films with different thicknesses in order to obtain sufficient reciprocal data for identifying the lattice constants with conventional X-ray sources. Complementary uses of GIXD with a two-dimensional detector, with much higher incident angles than the total reflection angle using a NANO-Viewer system and out-of-plane and in-plane measurements using SmartLab, enabled us to determine the complete lattice parameters for the MOβGal hemihydrate crystalline film. View Full-Text
Keywords: synthetic glycolipid; X-ray diffraction; grazing incidence X-ray diffraction; structural analysis; crystalline film synthetic glycolipid; X-ray diffraction; grazing incidence X-ray diffraction; structural analysis; crystalline film
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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Ogawa, S.; Takahashi, I. Structural Characterization of Perpendicularly Aligned Submicrometer-Thick Synthetic Glycolipid Polycrystalline Films Using Conventional X-ray Diffraction. Crystals 2017, 7, 356.

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