Next Article in Journal
A Graphene-Coated Mo Tip Array for Highly-Efficient Nanostructured Electron Field Emitters
Previous Article in Journal
Controllable Swarming and Assembly of Micro/Nanomachines
Article Menu
Issue 1 (January) cover image

Export Article

Open AccessLetter
Micromachines 2018, 9(1), 11; https://doi.org/10.3390/mi9010011

Microwave Wire Interrogation Method Mapping Pressure under High Temperatures

1
Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China
2
School of Chemical Engineering and Technology, North University of China, Taiyuan 030051, China
3
National Demonstration Center for Experimental Chemical Engineering Comprehensive Education, North University of China, Taiyuan 030051, China
*
Author to whom correspondence should be addressed.
Received: 13 November 2017 / Revised: 17 December 2017 / Accepted: 28 December 2017 / Published: 29 December 2017
View Full-Text   |   Download PDF [2447 KB, uploaded 29 December 2017]   |  

Abstract

It is widely accepted that wireless reading for in-situ mapping of pressure under high-temperature environments is the most feasible method, because it is not subject to frequent heterogeneous jointing failures and electrical conduction deteriorating, or even disappearing, under heat load. However, in this article, we successfully demonstrate an in-situ pressure sensor with wire interrogation for high-temperature applications. In this proof-of-concept study of the pressure sensor, we used a microwave resonator as a pressure-sensing component and a microwave transmission line as a pressure characteristic interrogation tunnel. In the sensor, the line and resonator are processed into a monolith, avoiding a heterogeneous jointing failure; further, microwave signal transmission does not depend on electrical conduction, and consequently, the sensor does not suffer from the heat load. We achieve pressure monitoring under 400 °C when employing the sensor simultaneously. Our sensor avoids restrictions that exist in wireless pressure interrogations, such as environmental noise and interference, signal leakage and security, low transfer efficiency, and so on. View Full-Text
Keywords: pressure sensor; wire interrogation; microwave; high-temperature environment pressure sensor; wire interrogation; microwave; high-temperature environment
Figures

Figure 1

This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

Share & Cite This Article

MDPI and ACS Style

Chen, X.; Yan, D.; Hong, Y.; Liang, T.; Xiong, J. Microwave Wire Interrogation Method Mapping Pressure under High Temperatures. Micromachines 2018, 9, 11.

Show more citation formats Show less citations formats

Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Related Articles

Article Metrics

Article Access Statistics

1

Comments

[Return to top]
Micromachines EISSN 2072-666X Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top