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Remote Sens. 2015, 7(5), 5329-5346; doi:10.3390/rs70505329

Spectral Index for Quantifying Leaf Area Index of Winter Wheat by Field Hyperspectral Measurements: A Case Study in Gifu Prefecture, Central Japan

1
Department of Forest Management, Forestry and Forest Products Research Institute, 1 Matsunosato, Tsukuba, Ibaraki 305-8687, Japan
2
Graduate School for International Development and Cooperation, Hiroshima University, 1-5-1 Kagamiyama, Higashi-Hiroshima 739-8529, Japan
3
Faculty of Engineering, Tohoku Institute of Technology, 35-1, YagiyamaKasumi-cho, Taihaku-ku, Sendai, Miyagi 982-8577, Japan
4
Gifu Prefectural Agricultural Technology Center, 729-1 Matamaru, Gifu 501-1152, Japan
5
Gifu Region Agriculture and Forestry Office, 5-14-53 YabutaMinami, Gifu 500-8384, Japan
6
River Basin Research Center, Gifu University, 1-1 Yanagido, Gifu 501-1193, Japan
*
Author to whom correspondence should be addressed.
Academic Editors: Tao Cheng, Zhengwei Yang, Yoshio Inoue, Yan Zhu, Weixing Cao and Prasad S. Thenkabail
Received: 1 December 2014 / Revised: 18 April 2015 / Accepted: 22 April 2015 / Published: 27 April 2015
(This article belongs to the Special Issue Recent Advances in Remote Sensing for Crop Growth Monitoring)
View Full-Text   |   Download PDF [10101 KB, uploaded 27 April 2015]   |  

Abstract

Timely and nondestructive monitoring of leaf area index (LAI) using remote sensing techniques is crucial for precise and efficient management of crops. In this paper, a new spectral index (SI) for estimating LAI of winter wheat (Triticum aestivum L.) is proposed on the basis of field hyperspectral measurements. A simple index based on the empirical relationships between LAIs and SIs of all available two-waveband combinations from hyperspectral data is developed by considering the difference between reflectance values at 760 and 739 nm (DSIR760–R739 = R760 – R739). Among published and newly developed SIs, DSIR760–R739 exhibited a significant and strong linear relationship with LAI and showed outstanding performance in LAI assessments. The permissible bandwidths for broad-band DSIR760–R739 investigated using simulated reflectance were 5 nm for both 760 and 739 nm center wavelengths. The results indicate that the linear regression model based on the narrow-band and broad-band DSIR760–R739 is a simple but accurate method for timely and nondestructive monitoring of LAI. View Full-Text
Keywords: ground-based measurement; hyperspectral; LAI; sensitivity; site-specific crop management; winter wheat ground-based measurement; hyperspectral; LAI; sensitivity; site-specific crop management; winter wheat
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MDPI and ACS Style

Tanaka, S.; Kawamura, K.; Maki, M.; Muramoto, Y.; Yoshida, K.; Akiyama, T. Spectral Index for Quantifying Leaf Area Index of Winter Wheat by Field Hyperspectral Measurements: A Case Study in Gifu Prefecture, Central Japan. Remote Sens. 2015, 7, 5329-5346.

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