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Journal: Sensors, 2009
Volume: 9
Page(s): 7988-8006
7988-8006
Article: A Coupled Field Multiphysics Modeling Approach to Investigate RF MEMS Switch Failure Modes under Various Operational Conditions
Sadek, K.; Lueke, J.; Moussa, W.

http://www.mdpi.com/1424-8220/9/10/7988

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