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Sensors 2018, 18(2), 371; https://doi.org/10.3390/s18020371

An Interdigital Electrode Probe for Detection, Localization and Evaluation of Surface Notch-Type Damage in Metals

1
School of Electronics and Information Engineering, Sichuan University, Chengdu 610065, China
2
National Key Laboratory of Aerospace Flight Dynamics, Northwestern Polytechnical University, Xi’an 710129, China
3
School of Electronics and Information, Northwestern Polytechnical University, Xi’an 710129, China
*
Author to whom correspondence should be addressed.
Received: 6 November 2017 / Revised: 29 December 2017 / Accepted: 21 January 2018 / Published: 27 January 2018
(This article belongs to the Special Issue Intelligent Sensing Technologies for Nondestructive Evaluation)
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Abstract

Available microwave notch-type damage detection sensors are typically based on monitoring frequency shift or magnitude changes. However, frequency shift testing needs sweep-frequency data that make scanning detection becomes difficult and time-consuming. This work presents a microwave near-field nondestructive testing sensor for detecting sub-millimeter notch-type damage detection in metallic surfaces. The sensor is loaded with an interdigital electrode element in an open-ended coaxial. It is simple to fabricate and inexpensive, as it is etched on the RC4003 patch by using printed circuit board technology. The detection is achieved by monitoring changes in reflection amplitude, which is caused by perturbing the electromagnetic field around the interdigital structure. The proposed sensor was tested on a metallic plate with different defects, and the experimental results indicated that the interdigital electrode probe can determine the orientation, localization and dimension of surface notch-type damage. View Full-Text
Keywords: interdigital electrode (IDE); metallic materials; microwave near-field detection; surface notch-type damage interdigital electrode (IDE); metallic materials; microwave near-field detection; surface notch-type damage
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Li, L.; Yang, X.; Yin, Y.; Yuan, J.; Li, X.; Li, L.; Huang, K. An Interdigital Electrode Probe for Detection, Localization and Evaluation of Surface Notch-Type Damage in Metals. Sensors 2018, 18, 371.

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