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Sensors 2017, 17(8), 1846; https://doi.org/10.3390/s17081846

Figure of Merit Enhancement of a Surface Plasmon Resonance Sensor Using a Low-Refractive-Index Porous Silica Film

1
College of Science, Beijing University of Chemical Technology, Beijing 100029, China
2
School of Materials Science and Technology, China University of Geosciences (Beijing), Beijing 100083, China
*
Authors to whom correspondence should be addressed.
Received: 7 July 2017 / Revised: 3 August 2017 / Accepted: 8 August 2017 / Published: 10 August 2017
(This article belongs to the Special Issue Surface Plasmon Resonance Sensing)
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Abstract

In this paper; the surface plasmon resonance (SPR) sensor with a porous silica film was studied. The effect of the thickness and porosity of the porous silica film on the performance of the sensor was analyzed. The results indicated that the figure of merit (FOM) of an SPR sensor can be enhanced by using a porous silica film with a low-refractive-index. Particularly; the FOM of an SPR sensor with 40 nm thick 90% porosity porous silica film; whose refractive index is 1.04 was improved by 311% when compared with that of a traditional SPR sensor. Furthermore; it was found that the decrease in the refractive index or the increase in the thickness of the low-refractive-index porous silica film can enlarge the FOM enhancement. It is believed that the proposed SPR sensor with a low-refractive-index porous silica film will be helpful for high-performance SPR sensors development. View Full-Text
Keywords: surface plasmon resonance sensor; figure of merit; porous silica; low-refractive-index surface plasmon resonance sensor; figure of merit; porous silica; low-refractive-index
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Meng, Q.-Q.; Zhao, X.; Lin, C.-Y.; Chen, S.-J.; Ding, Y.-C.; Chen, Z.-Y. Figure of Merit Enhancement of a Surface Plasmon Resonance Sensor Using a Low-Refractive-Index Porous Silica Film. Sensors 2017, 17, 1846.

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