Next Article in Journal
Detection of Four Distinct Volatile Indicators of Colorectal Cancer using Functionalized Titania Nanotubular Arrays
Next Article in Special Issue
A High Sensitivity Preamplifier for Quartz Tuning Forks in QEPAS (Quartz Enhanced PhotoAcoustic Spectroscopy) Applications
Previous Article in Journal
A Reliable Handoff Mechanism for Mobile Industrial Wireless Sensor Networks
Previous Article in Special Issue
Research on a Novel Exciting Method for a Sandwich Transducer Operating in Longitudinal-Bending Hybrid Modes
Article Menu
Issue 8 (August) cover image

Export Article

Open AccessArticle
Sensors 2017, 17(8), 1800; doi:10.3390/s17081800

A Multiscale Material Testing System for In Situ Optical and Electron Microscopes and Its Application

Department of Engineering Mechanics, Applied Mechanics Lab., Tsinghua University, Beijing 100084, China
Aero Engine Academy of China, Beijing 101304, China
Center for Nano and Micro Mechanics, Tsinghua University, Beijing 100084, China
Suzhou Delve Test Precise-Instrument Co., Ltd., Suzhou 215000, China
Institute of Microelectronics, Tsinghua University, Beijing 100084, China
Author to whom correspondence should be addressed.
Received: 6 June 2017 / Revised: 21 July 2017 / Accepted: 2 August 2017 / Published: 4 August 2017
(This article belongs to the Special Issue Piezoelectric Micro- and Nano-Devices)
View Full-Text   |   Download PDF [16358 KB, uploaded 5 August 2017]   |  


We report a novel material testing system (MTS) that uses hierarchical designs for in-situ mechanical characterization of multiscale materials. This MTS is adaptable for use in optical microscopes (OMs) and scanning electron microscopes (SEMs). The system consists of a microscale material testing module (m-MTM) and a nanoscale material testing module (n-MTM). The MTS can measure mechanical properties of materials with characteristic lengths ranging from millimeters to tens of nanometers, while load capacity can vary from several hundred micronewtons to several nanonewtons. The m-MTM is integrated using piezoelectric motors and piezoelectric stacks/tubes to form coarse and fine testing modules, with specimen length from millimeters to several micrometers, and displacement distances of 12 mm with 0.2 µm resolution for coarse level and 8 µm with 1 nm resolution for fine level. The n-MTM is fabricated using microelectromechanical system technology to form active and passive components and realizes material testing for specimen lengths ranging from several hundred micrometers to tens of nanometers. The system’s capabilities are demonstrated by in-situ OM and SEM testing of the system’s performance and mechanical properties measurements of carbon fibers and metallic microwires. In-situ multiscale deformation tests of Bacillus subtilis filaments are also presented. View Full-Text
Keywords: multiscale; material testing system and force sensor; mechanical property; Bacillus subtilis filament multiscale; material testing system and force sensor; mechanical property; Bacillus subtilis filament

Figure 1

This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

Scifeed alert for new publications

Never miss any articles matching your research from any publisher
  • Get alerts for new papers matching your research
  • Find out the new papers from selected authors
  • Updated daily for 49'000+ journals and 6000+ publishers
  • Define your Scifeed now

SciFeed Share & Cite This Article

MDPI and ACS Style

Ye, X.; Cui, Z.; Fang, H.; Li, X. A Multiscale Material Testing System for In Situ Optical and Electron Microscopes and Its Application. Sensors 2017, 17, 1800.

Show more citation formats Show less citations formats

Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Related Articles

Article Metrics

Article Access Statistics



[Return to top]
Sensors EISSN 1424-8220 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top