Aspheric Surface Measurement Using Capacitive Sensors
AbstractThis paper proposes a new method for the measurement of spherical coordinates by using capacitive sensors as a non-contact probe solution of measurement of aspheric surfaces. The measurement of the average effect of the capacitive probe and the influence of capacitive probe tilting were studied with respect to an eccentric spherical surface. Based on the tested characteristic curve of the average effect of the sphere and probe, it was found that nonlinear and linear compensation resulted in high measurement accuracy. The capacitance probe was found to be trying to fulfill a need for performing nm-level precision measurement of aspheric electromagnetic surfaces. View Full-Text
Scifeed alert for new publicationsNever miss any articles matching your research from any publisher
- Get alerts for new papers matching your research
- Find out the new papers from selected authors
- Updated daily for 49'000+ journals and 6000+ publishers
- Define your Scifeed now
Yuan, D.; Zhao, H.; Tao, X.; Li, S.; Zhu, X.; Zhang, C. Aspheric Surface Measurement Using Capacitive Sensors. Sensors 2017, 17, 1355.
Yuan D, Zhao H, Tao X, Li S, Zhu X, Zhang C. Aspheric Surface Measurement Using Capacitive Sensors. Sensors. 2017; 17(6):1355.Chicago/Turabian Style
Yuan, Daocheng; Zhao, Huiying; Tao, Xin; Li, Shaobo; Zhu, Xueliang; Zhang, Chupeng. 2017. "Aspheric Surface Measurement Using Capacitive Sensors." Sensors 17, no. 6: 1355.
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.