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Sensors 2017, 17(12), 2863; doi:10.3390/s17122863

An AST-ELM Method for Eliminating the Influence of Charging Phenomenon on ECT

1
Key Laboratory of Education Ministry for Photoelectric Logging and Detecting of Oil and Gas, Xi’an Shiyou University, Xi’an 710065, China
2
State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, China
*
Author to whom correspondence should be addressed.
Received: 9 October 2017 / Revised: 20 November 2017 / Accepted: 5 December 2017 / Published: 9 December 2017
(This article belongs to the Section Physical Sensors)
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Abstract

Electrical capacitance tomography (ECT) is a promising imaging technology of permittivity distributions in multiphase flow. To reduce the effect of charging phenomenon on ECT measurement, an improved extreme learning machine method combined with adaptive soft-thresholding (AST-ELM) is presented and studied for image reconstruction. This method can provide a nonlinear mapping model between the capacitance values and medium distributions by using machine learning but not an electromagnetic-sensitive mechanism. Both simulation and experimental tests are carried out to validate the performance of the presented method, and reconstructed images are evaluated by relative error and correlation coefficient. The results have illustrated that the image reconstruction accuracy by the proposed AST-ELM method has greatly improved than that by the conventional methods under the condition with charging object. View Full-Text
Keywords: electrical capacitance tomography (ECT); charging phenomenon; extreme learning machine; adaptive soft-thresholding electrical capacitance tomography (ECT); charging phenomenon; extreme learning machine; adaptive soft-thresholding
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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Wang, X.; Hu, H.; Jia, H.; Tang, K. An AST-ELM Method for Eliminating the Influence of Charging Phenomenon on ECT. Sensors 2017, 17, 2863.

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