An AST-ELM Method for Eliminating the Influence of Charging Phenomenon on ECT
AbstractElectrical capacitance tomography (ECT) is a promising imaging technology of permittivity distributions in multiphase flow. To reduce the effect of charging phenomenon on ECT measurement, an improved extreme learning machine method combined with adaptive soft-thresholding (AST-ELM) is presented and studied for image reconstruction. This method can provide a nonlinear mapping model between the capacitance values and medium distributions by using machine learning but not an electromagnetic-sensitive mechanism. Both simulation and experimental tests are carried out to validate the performance of the presented method, and reconstructed images are evaluated by relative error and correlation coefficient. The results have illustrated that the image reconstruction accuracy by the proposed AST-ELM method has greatly improved than that by the conventional methods under the condition with charging object. View Full-Text
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Wang, X.; Hu, H.; Jia, H.; Tang, K. An AST-ELM Method for Eliminating the Influence of Charging Phenomenon on ECT. Sensors 2017, 17, 2863.
Wang X, Hu H, Jia H, Tang K. An AST-ELM Method for Eliminating the Influence of Charging Phenomenon on ECT. Sensors. 2017; 17(12):2863.Chicago/Turabian Style
Wang, Xiaoxin; Hu, Hongli; Jia, Huiqin; Tang, Kaihao. 2017. "An AST-ELM Method for Eliminating the Influence of Charging Phenomenon on ECT." Sensors 17, no. 12: 2863.
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