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Sensors 2016, 16(5), 616; doi:10.3390/s16050616

Guidelines for Designing Surface Ion Traps Using the Boundary Element Method

1
ISRC/ASRI, Department of Electrical and Computer Engineering, Seoul National University, Seoul 151-744, Korea
2
Quantum Tech. Lab., SK Telecom, Seongnam-si, Gyeonggi-do 463-784, Korea
*
Authors to whom correspondence should be addressed.
Academic Editor: Vittorio M. N. Passaro
Received: 24 February 2016 / Revised: 21 April 2016 / Accepted: 22 April 2016 / Published: 28 April 2016
(This article belongs to the Section Physical Sensors)
View Full-Text   |   Download PDF [6598 KB, uploaded 28 April 2016]   |  

Abstract

Ion traps can provide both physical implementation of quantum information processing and direct observation of quantum systems. Recently, surface ion traps have been developed using microfabrication technologies and are considered to be a promising platform for scalable quantum devices. This paper presents detailed guidelines for designing the electrodes of surface ion traps. First, we define and explain the key specifications including trap depth, q-parameter, secular frequency, and ion height. Then, we present a numerical-simulation-based design procedure, which involves determining the basic assumptions, determining the shape and size of the chip, designing the dimensions of the radio frequency (RF) electrode, and analyzing the direct current (DC) control voltages. As an example of this design procedure, we present a case study with tutorial-like explanations. The proposed design procedure can provide a practical guideline for designing the electrodes of surface ion traps. View Full-Text
Keywords: surface ion trap; electrode dimensions; design optimization; boundary element method; microfabrication surface ion trap; electrode dimensions; design optimization; boundary element method; microfabrication
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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Hong, S.; Lee, M.; Cheon, H.; Kim, T.; Cho, D.-I.“. Guidelines for Designing Surface Ion Traps Using the Boundary Element Method. Sensors 2016, 16, 616.

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