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Sensors 2016, 16(12), 2195; doi:10.3390/s16122195

Configurations of Splitter/Combiner Microstrip Sections Loaded with Stepped Impedance Resonators (SIRs) for Sensing Applications

CIMITEC, Departament d’Enginyeria Electrònica, Universitat Autònoma de Barcelona, Bellaterra, 08193 Barcelona, Spain
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Author to whom correspondence should be addressed.
Academic Editor: Vittorio M. N. Passaro
Received: 14 November 2016 / Revised: 12 December 2016 / Accepted: 16 December 2016 / Published: 20 December 2016
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Abstract

In this paper, several configurations of splitter/combiner microstrip sections loaded with stepped impedance resonators (SIRs) are analyzed. Such structures are useful as sensors and comparators, and the main aim of the paper is to show that the proposed configurations are useful for the optimization of sensitivity and discrimination. Specifically, for comparison purposes, i.e., to determine anomalies, abnormalities or defects of a sample under test (SUT) in comparison to a reference sample, it is shown that up to three samples can be simultaneously tested. Simple models of the proposed structures are presented, and these models are validated through electromagnetic simulation and experiment. Finally, the principle of operation is validated through a proof-of-concept demonstrator. View Full-Text
Keywords: stepped impedance resonator (SIR); microstrip technology; microwave sensors; differential sensors stepped impedance resonator (SIR); microstrip technology; microwave sensors; differential sensors
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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MDPI and ACS Style

Su, L.; Mata-Contreras, J.; Vélez, P.; Martín, F. Configurations of Splitter/Combiner Microstrip Sections Loaded with Stepped Impedance Resonators (SIRs) for Sensing Applications. Sensors 2016, 16, 2195.

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