Abstract: For achieve sensitivity in lab-on-a-chip electrochemical detection, more reliable probing methods are required, especially for repeated measurements. Spring-probes are a promising candidate method which can replace needle-like probes and alligator clips that usually produce scratches on the surface of gold electrodes due to the strong physical contacts needed for electrochemical measurements. The superior reliability of amperometric measurements by a spring-probe system was compared with results by conventional probing methods. We demonstrated that a universal spring-probe system would be potentially suitable to achieve high performance in lab-on-a-chip devices using electrochemical detection.
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Lee, M.-K.; Lee, T.J.; Choi, H.W.; Shin, S.J.; Park, J.Y.; Lee, S.J. A Universal Spring-Probe System for Reliable Probing of Electrochemical Lab-on-a-Chip Devices. Sensors 2014, 14, 944-956.
Lee M-K, Lee TJ, Choi HW, Shin SJ, Park JY, Lee SJ. A Universal Spring-Probe System for Reliable Probing of Electrochemical Lab-on-a-Chip Devices. Sensors. 2014; 14(1):944-956.
Lee, Moon-Keun; Lee, Tae J.; Choi, Ho W.; Shin, Su J.; Park, Jung Y.; Lee, Seok J. 2014. "A Universal Spring-Probe System for Reliable Probing of Electrochemical Lab-on-a-Chip Devices." Sensors 14, no. 1: 944-956.