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Journal: Sensors, 2014
Volume: 14
Number: 1528

Article: RTS Noise and Dark Current White Defects Reduction Using Selective Averaging Based on a Multi-Aperture System
Authors: by Bo Zhang, Keiichiro Kagawa, Taishi Takasawa, Min Woong Seo, Keita Yasutomi and Shoji Kawahito
Link: https://www.mdpi.com/1424-8220/14/1/1528

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