Sensors 2013, 13(4), 4327-4347; doi:10.3390/s130404327
Article

Nonlinear Detection for a High Rate Extended Binary Phase Shift Keying System

Received: 5 March 2013; in revised form: 16 March 2013 / Accepted: 28 March 2013 / Published: 28 March 2013
(This article belongs to the Special Issue Medical & Biological Imaging)
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Abstract: The algorithm and the results of a nonlinear detector using a machine learning technique called support vector machine (SVM) on an efficient modulation system with high data rate and low energy consumption is presented in this paper. Simulation results showed that the performance achieved by the SVM detector is comparable to that of a conventional threshold decision (TD) detector. The two detectors detect the received signals together with the special impacting filter (SIF) that can improve the energy utilization efficiency. However, unlike the TD detector, the SVM detector concentrates not only on reducing the BER of the detector, but also on providing accurate posterior probability estimates (PPEs), which can be used as soft-inputs of the LDPC decoder. The complexity of this detector is considered in this paper by using four features and simplifying the decision function. In addition, a bandwidth efficient transmission is analyzed with both SVM and TD detector. The SVM detector is more robust to sampling rate than TD detector. We find that the SVM is suitable for extended binary phase shift keying (EBPSK) signal detection and can provide accurate posterior probability for LDPC decoding.
Keywords: support vector machine; low density parity check codes; extended binary phase shift keying; posterior probability; intermediate frequency demodulator
PDF Full-text Download PDF Full-Text [430 KB, uploaded 21 June 2014 06:47 CEST]

Export to BibTeX |
EndNote


MDPI and ACS Style

Chen, X.-Q.; Wu, L.-N. Nonlinear Detection for a High Rate Extended Binary Phase Shift Keying System. Sensors 2013, 13, 4327-4347.

AMA Style

Chen X-Q, Wu L-N. Nonlinear Detection for a High Rate Extended Binary Phase Shift Keying System. Sensors. 2013; 13(4):4327-4347.

Chicago/Turabian Style

Chen, Xian-Qing; Wu, Le-Nan. 2013. "Nonlinear Detection for a High Rate Extended Binary Phase Shift Keying System." Sensors 13, no. 4: 4327-4347.

Sensors EISSN 1424-8220 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert