Sensors 2013, 13(3), 2986-2996; doi:10.3390/s130302986
Article

Mid-Infrared Lifetime Imaging for Viability Evaluation of Lettuce Seeds Based on Time-Dependent Thermal Decay Characterization

Received: 7 February 2013; in revised form: 25 February 2013 / Accepted: 27 February 2013 / Published: 1 March 2013
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Abstract: An infrared lifetime thermal imaging technique for the measurement of lettuce seed viability was evaluated. Thermal emission signals from mid-infrared images of healthy seeds and seeds aged for 24, 48, and 72 h were obtained and reconstructed using regression analysis. The emission signals were fitted with a two-term exponential model that had two amplitudes and two time variables as lifetime parameters. The lifetime thermal decay parameters were significantly different for seeds with different aging times. Single-seed viability was visualized using thermal lifetime images constructed from the calculated lifetime parameter values. The time-dependent thermal signal decay characteristics, along with the decay amplitude and delay time images, can be used to distinguish aged lettuce seeds from normal seeds.
Keywords: mid-infrared thermography; thermal lifetime image; nondestructive test; lettuce seed; seed viability
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MDPI and ACS Style

Kim, G.; Kim, G.H.; Ahn, C.-K.; Yoo, Y.; Cho, B.-K. Mid-Infrared Lifetime Imaging for Viability Evaluation of Lettuce Seeds Based on Time-Dependent Thermal Decay Characterization. Sensors 2013, 13, 2986-2996.

AMA Style

Kim G, Kim GH, Ahn C-K, Yoo Y, Cho B-K. Mid-Infrared Lifetime Imaging for Viability Evaluation of Lettuce Seeds Based on Time-Dependent Thermal Decay Characterization. Sensors. 2013; 13(3):2986-2996.

Chicago/Turabian Style

Kim, Ghiseok; Kim, Geon H.; Ahn, Chi-Kook; Yoo, Yoonkyu; Cho, Byoung-Kwan. 2013. "Mid-Infrared Lifetime Imaging for Viability Evaluation of Lettuce Seeds Based on Time-Dependent Thermal Decay Characterization." Sensors 13, no. 3: 2986-2996.

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